New Arrivals/Restock

Soft-Matter Characterization

flash sale iconLimited Time Sale
Until the end
23
11
45

$216.82 cheaper than the new price!!

Free shipping for purchases over $99 ( Details )
Free cash-on-delivery fees for purchases over $99
Please note that the sales price and tax displayed may differ between online and in-store. Also, the product may be out of stock in-store.
New  $361.37
quantity

Product details

Management number 231452503 Release Date 2026/06/18 List Price $144.55 Model Number 231452503
Category

This 2 volume 4-part set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers. This will appeal to soft matter scientists at the graduate level and above, condensed matter physicists, chemists, biologists, medical doctors and engineers. Read more

ASIN B0BW8LHZ6Y
XRay Not Enabled
ISBN13 978-1402044656
Language English
File size 32.1 MB
Page Flip Enabled
Publisher Springer
Word Wise Not Enabled
Print length 2364 pages
Accessibility Learn more
Screen Reader Supported
Publication date December 4, 2008
Enhanced typesetting Enabled

Correction of product information

If you notice any omissions or errors in the product information on this page, please use the correction request form below.

Correction Request Form

Product Review

You must be logged in to post a review